Synthesis method of easy-tested in some basis circuits admitting single fault detection tests of constant lenght / D. S. Romanov. //Vestnik Moskovskogo Universiteta. Seriya 1. Matematika. Mekhanika. 2012. № 2. P. 24-29 [Moscow Univ. Math. Bulletin. Vol. 67, N 2, 2012.].
It is constructively proved that any Boolean function of n variables may be implemented in the basis of gates {x&y, x ⊕ y, 1, ¬x(y ∨ z) ∨ x(y ~ z)} by a testable combinational circuit admitting a fault detection test set whose power does not exceed 4 under arbitrary single inverse or constant (stuck-at) faults at outputs of gates.
Key words: combinational circuit, fault detection test set, constant (stuck-at) fault at output of gate, inverse fault at output of gate, Shannon function, easy-testable circuit.